dc.identifier.citation |
[1] J. LaDou, “Printed circuit board industry,” Int J Hyg Environ Health, vol. 209, no. 3, pp. 211–219, May 2006, doi: 10.1016/J.IJHEH.2006.02.001. [2] V. U. Sankar, G. Lakshmi, and Y. S. Sankar, “A Review of Various Defects in PCB,” Journal of Electronic Testing: Theory and Applications (JETTA), vol. 38, no. 5, pp. 481– 491, Oct. 2022, doi: 10.1007/S10836-022-06026-7/FIGURES/3. [3] B. Hu and J. Wang, “Detection of PCB Surface Defects with Improved Faster-RCNN and Feature Pyramid Network,” IEEE Access, vol. 8, pp. 108335–108345, 2020, doi: 10.1109/ACCESS.2020.3001349. [4] L. Song et al., “PCB Electronic Component Defect Detection Method based on Improved YOLOv4 Algorithm,” J Phys Conf Ser, vol. 1827, no. 1, p. 012167, Mar. 2021, doi: 10.1088/1742-6596/1827/1/012167. [5] S. Tang, F. He, X. Huang, and J. Yang, “Online PCB Defect Detector On A New PCB Defect Dataset,” Feb. 2019, Accessed: Jun. 25, 2024. [Online]. Available: https://arxiv.org/abs/1902.06197v1 [6] B. Du, F. Wan, G. Lei, L. Xu, C. Xu, and Y. Xiong, “YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5,” Electronics 2023, Vol. 12, Page 2821, vol. 12, no. 13, p. 2821, Jun. 2023, doi: 10.3390/ELECTRONICS12132821. [7] J. Tang, S. Liu, D. Zhao, L. Tang, W. Zou, and B. Zheng, “PCB-YOLO: An Improved Detection Algorithm of PCB Surface Defects Based on YOLOv5,” Sustainability 2023, Vol. 15, Page 5963, vol. 15, no. 7, p. 5963, Mar. 2023, doi: 10.3390/SU15075963. [8] C. Liu, X. Zhou, J. Li, and C. Ran, “PCB Board Defect Detection Method based on Improved YOLOv8,” Frontiers in Computing and Intelligent Systems, vol. 6, no. 2, pp. 1–6, Dec. 2023, doi: 10.54097/FCIS.V6I2.01. [9] H. Aregawi and M. Abdo, “Effects of etching process inaccuracy in the malfunctioning level of PCB circuits - a simulaton based analysis,” Zede Journal, vol. 38, no. 1, pp. 53– 63, Dec. 2020, Accessed: Jun. 25, 2024. [Online]. Available: https://www.ajol.info/index.php/zj/article/view/202431 [10] M. Yu, X. Zeng, Q. Song, L. Liu, and J. Li, “Examining regeneration technologies for etching solutions: a critical analysis of the characteristics and potentials,” J Clean Prod, vol. 113, pp. 973–980, Feb. 2016, doi: 10.1016/J.JCLEPRO.2015.10.131. [11] Y. Bi, B. Xue, P. Mesejo, S. Cagnoni, and M. Zhang, “A Survey on Evolutionary Computation for Computer Vision and Image Analysis: Past, Present, and Future Trends,” IEEE Transactions on Evolutionary Computation, vol. 27, no. 1, pp. 5–25, Feb. 2023, doi: 10.1109/TEVC.2022.3220747. [12] T. K. Gupta and K. Raza, “Optimization of ANN Architecture: A Review on Nature Inspired Techniques,” Machine Learning in Bio-Signal Analysis and Diagnostic Imaging, pp. 159–182, Jan. 2019, doi: 10.1016/B978-0-12-816086-2.00007-2. PAGE | 83 [13] J.-W. Lin, “Artificial Neural Network Related to Biological Neuron Network: A Review,” Advanced Studies in Medical Sciences, vol. 5, no. 1, pp. 55–62, 2017, doi: 10.12988/asms.2017.753. [14] Z. Jin, “Application of WCA-RBF Neural Network in Fault Diagnosis of Analog Circuits,” International Transactions on Electrical Energy Systems, vol. 2023, 2023, doi: 10.1155/2023/8812152. [15] Engin Pekel, “A COMPREHENSIVE REVIEW FOR ARTIFICAL NEURAL NETWORK APPLICATION TO PUBLIC TRANSPORTATION,” Hitit University. Accessed: Jun. 24, 2024. [Online]. Available: https://www.researchgate.net/publication/315111480_A_COMPREHENSIVE_REVIE W_FOR_ARTIFICAL_NEURAL_NETWORK_APPLICATION_TO_PUBLIC_TRA NSPORTATION [16] J. Singh and R. Banerjee, “A study on single and multi-layer perceptron neural network,” Proceedings of the 3rd International Conference on Computing Methodologies and Communication, ICCMC 2019, pp. 35–40, Mar. 2019, doi: 10.1109/ICCMC.2019.8819775. [17] Shekhar Banerjee, “Exploring the Power and Limitations of Multi-Layer Perceptron (MLP) in Machine Learning,” Medium. Accessed: Jun. 24, 2024. [Online]. Available: https://shekhar-banerjee96.medium.com/exploring-the-power-and-limitations-of-multi layer-perceptron-mlp-in-machine-learning-d97a3f84f9f4 [18] M.-C. Popescu and V. E. Balas, “Multilayer Perceptron and Neural Networks”. [19] K. O’Shea and R. Nash, “An Introduction to Convolutional Neural Networks,” Int J Res Appl Sci Eng Technol, vol. 10, no. 12, pp. 943–947, Nov. 2015, doi: 10.22214/ijraset.2022.47789. [20] M. Azzeh, A. Alkhateeb, and A. Bou Nassif, “Software effort estimation using convolutional neural network and fuzzy clustering,” Neural Comput Appl, 2024, doi: 10.1007/S00521-024-09855-Z. [21] M. J. Akhtar et al., “A Robust Framework for Object Detection in a Traffic Surveillance System,” Electronics (Switzerland), vol. 11, no. 21, Nov. 2022, doi: 10.3390/ELECTRONICS11213425. [22] R. S. Samosir, E. Abdurachman, F. L. Gaol, and B. S. Sabarguna, “Hybrid method architecture design of mri brain tumors image segmentation,” ICIC Express Letters, vol. 14, no. 12, pp. 1177–1184, Dec. 2020, doi: 10.24507/ICICEL.14.12.1177. [23] “Convolutional Neural Network and its Architectures,” 2021, doi: 10.37591/JoCTA. [24] M. A. Islam, M. Kowal, S. Jia, K. G. Derpanis, and N. D. B. Bruce, “Position, Padding and Predictions: A Deeper Look at Position Information in CNNs,” Int J Comput Vis, pp. 1–22, Apr. 2024, doi: 10.1007/S11263-024-02069-9/FIGURES/18. [25] S. K. R. Meruva, V. G. S. Tulasi, N. Vinnakota, and V. Bhavana, “Risk Level Prediction of Diabetic Retinopathy based on Retinal Images using Deep Learning Algorithm,” Procedia Comput Sci, vol. 215, pp. 722–730, 2022, doi: 10.1016/J.PROCS.2022.12.074. PAGE | 84 [26] Z. Li, F. Liu, W. Yang, S. Peng, and J. Zhou, “A Survey of Convolutional Neural Networks: Analysis, Applications, and Prospects,” IEEE Trans Neural Netw Learn Syst, vol. 33, no. 12, pp. 6999–7019, Dec. 2022, doi: 10.1109/TNNLS.2021.3084827. [27] P. Rajeshwari, P. Abhishek, and P. S. | T. Vinod, “Object Detection: An Overview,” International Journal of Trend in Scientific Research and Development, vol. Volume-3, no. Issue-3, pp. 1663–1665, Apr. 2019, doi: 10.31142/IJTSRD23422. [28] M. V. Athira and D. M. Khan, “Recent Trends on Object Detection and Image Classification: A Review,” 2020 International Conference on Computational Performance Evaluation, ComPE 2020, pp. 427–435, Jul. 2020, doi: 10.1109/COMPE49325.2020.9200080. [29] C. Li et al., “YOLOv6: A Single-Stage Object Detection Framework for Industrial Applications,” Sep. 2022, Accessed: Jun. 24, 2024. [Online]. Available: https://arxiv.org/abs/2209.02976v1 [30] J. Gu et al., “Recent advances in convolutional neural networks,” Pattern Recognit, vol. 77, pp. 354–377, May 2018, doi: 10.1016/J.PATCOG.2017.10.013. [31] Y. Chen, M. C. Goorden, F. J. Beekman, L. Du, R. Zhang, and X. Wang, “Overview of two-stage object detection algorithms,” J Phys Conf Ser, vol. 1544, no. 1, p. 012033, May 2020, doi: 10.1088/1742-6596/1544/1/012033. [32] M. Asif, S. Liu, G. M. Ali, A. Bouferguene, and M. Al-Hussein, “The Effectiveness of Data Augmentation in Construction Site-Related Image Classification,” Lecture Notes in Civil Engineering, vol. 363 LNCE, pp. 247–257, 2023, doi: 10.1007/978-3-031- 34593-7_16. [33] “Closer Look at IC Pin Inspection With Bi-Telecentric Lenses,” https://vicoimaging.com/, Accessed: Jun. 24, 2024. [Online]. Available: https://vicoimaging.com/bi-telecentric-lenses-for-ic-pin-inspection/ [34] S. D. Kalro, P. B. G, M. B. S, and P. H. D, “PCB Defect Detection Using Image Subtraction Algorithm,” International Journal of Computer Science Trends and Technology, vol. 3, Accessed: Jun. 24, 2024. [Online]. Available: www.ijcstjournal.org [35] R. R. Chavan, S. A. Chavan, G. D. Dokhe, M. B. Wagh, and A. S. Vaidya, “Quality Control of PCB using Image Processing,” Article in International Journal of Computer Applications, vol. 141, no. 5, pp. 975–8887, 2016, doi: 10.5120/ijca2016909623. [36] V. Chaudhary, I. R. Dave, and K. P. Upla, “Automatic visual inspection of printed circuit board for defect detection and classification,” Proceedings of the 2017 International Conference on Wireless Communications, Signal Processing and Networking, WiSPNET 2017, vol. 2018-January, pp. 732–737, Jul. 2017, doi: 10.1109/WISPNET.2017.8299858. [37] “Venture’s PCB Assembly Visual Inspection for Quality Control.” Accessed: Jun. 24, 2024. [Online]. Available: https://www.venture-mfg.com/visual-quality-inspection/ PAGE | 85 [38] V. H. Gaidhane, Y. V. Hote, and V. Singh, “An efficient similarity measure approach for PCB surface defect detection,” Pattern Analysis and Applications, vol. 21, no. 1, pp. 277–289, Feb. 2018, doi: 10.1007/S10044-017-0640-9/TABLES/5. [39] D. M. Tsai and C. K. Huang, “Defect Detection in Electronic Surfaces Using Template Based Fourier Image Reconstruction,” IEEE Trans Compon Packaging Manuf Technol, vol. 9, no. 1, pp. 163–172, Jan. 2019, doi: 10.1109/TCPMT.2018.2873744. [40] A. A. I. M. Hassanin, F. E. Abd El-Samie, and G. M. El Banby, “A real-time approach for automatic defect detection from PCBs based on SURF features and morphological operations,” Multimed Tools Appl, vol. 78, no. 24, pp. 34437–34457, Dec. 2019, doi: 10.1007/S11042-019-08097-9/TABLES/3. [41] Z. Yuan, X. Tang, H. Ning, and Z. Yang, “LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards,” Symmetry 2024, Vol. 16, Page 418, vol. 16, no. 4, p. 418, Apr. 2024, doi: 10.3390/SYM16040418. [42] K. D. Kang, I. M. S. K. Ilankoon, N. Dushyantha, and M. N. Chong, “Assessment of Pre-Treatment Techniques for Coarse Printed Circuit Boards (PCBs) Recycling,” Minerals 2021, Vol. 11, Page 1134, vol. 11, no. 10, p. 1134, Oct. 2021, doi: 10.3390/MIN11101134. [43] A. Bhattacharya and S. G. Cloutier, “End-to-end deep learning framework for printed circuit board manufacturing defect classification,” Scientific Reports 2022 12:1, vol. 12, no. 1, pp. 1–13, Jul. 2022, doi: 10.1038/s41598-022-16302-3. [44] K. Singh, S. Kharche, A. Chauhan, and P. Salvi, “PCB Defect Detection Methods: A Review of Existing Methods and Potential Enhancements,” Journal of Engineering Science and Technology Review, vol. 17, no. 1, pp. 156–167, 2024, doi: 10.25103/jestr.171.19. [45] G. Liu and H. Wen, “Printed circuit board defect detection based on MobileNet-Yolo Fast,” https://doi.org/10.1117/1.JEI.30.4.043004, vol. 30, no. 4, p. 043004, Jul. 2021, doi: 10.1117/1.JEI.30.4.043004. [46] Z. Xiong, “A Design of Bare Printed Circuit Board Defect Detection System Based on YOLOv8,” Highlights in Science, Engineering and Technology, vol. 57, pp. 203–209, Jul. 2023, doi: 10.54097/HSET.V57I.10002. [47] W. Huang and P. Wei, “A PCB Dataset for Defects Detection and Classification,” vol. 14, no. 8, Jan. 2019, Accessed: Jun. 24, 2024. [Online]. Available: https://arxiv.org/abs/1901.08204v1 [48] V. A. Adibhatla, H. C. Chih, C. C. Hsu, J. Cheng, M. F. Abbod, and J. S. Shieh, “Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once,” Mathematical Biosciences and Engineering, vol. 18, no. 4, pp. 4411–4428, 2021, doi: 10.3934/MBE.2021223. [49] V. A. Adibhatla, H. C. Chih, C. C. Hsu, J. Cheng, M. F. Abbod, and J. S. Shieh, “Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks,” Electronics 2020, Vol. 9, Page 1547, vol. 9, no. 9, p. 1547, Sep. 2020, doi: 10.3390/ELECTRONICS9091547. PAGE | 86 [50] W. Chen, Z. Huang, Q. Mu, and Y. Sun, “PCB Defect Detection Method Based on Transformer-YOLO,” IEEE Access, vol. 10, pp. 129480–129489, 2022, doi: 10.1109/ACCESS.2022.3228206. [51] G. Zhou, L. Yu, Y. Su, B. Xu, and G. Zhou, “Lightweight PCB defect detection algorithm based on MSD-YOLO,” Cluster Comput, vol. 27, no. 3, pp. 3559–3573, Jun. 2023, doi: 10.1007/S10586-023-04156-X/FIGURES/15. [52] K. Xia et al., “Global contextual attention augmented YOLO with ConvMixer prediction heads for PCB surface defect detection,” Scientific Reports 2023 13:1, vol. 13, no. 1, pp. 1–16, Jun. 2023, doi: 10.1038/s41598-023-36854-2. [53] Y. ; Jiang, M. ; Cai, D. Zhang, Y. Jiang, M. Cai, and D. Zhang, “Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards,” Sensors 2023, Vol. 23, Page 7310, vol. 23, no. 17, p. 7310, Aug. 2023, doi: 10.3390/S23177310. [54] F. R. Leta, F. F. Feliciano, and F. P. R. Martins, “COMPUTER VISION SYSTEM FOR PRINTED CIRCUIT BOARD INSPECTION”. [55] Q. Ling and N. A. M. Isa, “Printed Circuit Board Defect Detection Methods Based on Image Processing, Machine Learning and Deep Learning: A Survey,” IEEE Access, vol. 11, pp. 15921–15944, 2023, doi: 10.1109/ACCESS.2023.3245093. [56] P. Chen and F. Xie, “A Machine Learning Approach for Automated Detection of Critical PCB Flaws in Optical Sensing Systems,” Photonics 2023, Vol. 10, Page 984, vol. 10, no. 9, p. 984, Aug. 2023, doi: 10.3390/PHOTONICS10090984. [57] B. Feng and J. Cai, “PCB Defect Detection via Local Detail and Global Dependency Information,” Sensors 2023, Vol. 23, Page 7755, vol. 23, no. 18, p. 7755, Sep. 2023, doi: 10.3390/S23187755. [58] T. Diwan, G. Anirudh, and J. V. Tembhurne, “Object detection using YOLO: challenges, architectural successors, datasets and applications,” Multimed Tools Appl, vol. 82, no. 6, pp. 9243–9275, Mar. 2023, doi: 10.1007/S11042-022-13644- Y/TABLES/7. [59] Z. Huang, J. Wang, X. Fu, T. Yu, Y. Guo, and R. Wang, “DC-SPP-YOLO: Dense connection and spatial pyramid pooling based YOLO for object detection,” Inf Sci (N Y), vol. 522, pp. 241–258, Jun. 2020, doi: 10.1016/J.INS.2020.02.067. [60] D.-H. Jeon, T.-S. Kim, and J.-S. Kim, “A Method for Reducing False Negative Rate in Non-Maximum Suppression of YOLO Using Bounding Box Density,” Journal of Multimedia Information System, vol. 10, no. 4, pp. 293–300, Dec. 2023, doi: 10.33851/JMIS.2023.10.4.293. [61] M. J. Shafiee, B. Chywl, F. Li, and A. Wong, “Fast YOLO: A Fast You Only Look Once System for Real-time Embedded Object Detection in Video,” Journal of Computational Vision and Imaging Systems, vol. 3, no. 1, Sep. 2017, doi: 10.15353/vsnl.v3i1.171. [62] Y. Li and F. Ren, “Light-Weight RetinaNet for Object Detection,” May 2019, Accessed: Jun. 24, 2024. [Online]. Available: https://arxiv.org/abs/1905.10011v1 PAGE | 87 [63] X. Li, H. Zhao, and L. Zhang, “Recurrent RetinaNet: A Video Object Detection Model Based on Focal Loss,” Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 11304 LNCS, pp. 499–508, 2018, doi: 10.1007/978-3-030-04212-7_44. [64] L. J. Biffi et al., “ATSS Deep Learning-Based Approach to Detect Apple Fruits,” Remote Sensing 2021, Vol. 13, Page 54, vol. 13, no. 1, p. 54, Dec. 2020, doi: 10.3390/RS13010054. [65] L. Shi, H. Zu, J. Tai, and W. Niu, “A welding defect detection model based on a shape aware network,” Journal of Intelligent & Fuzzy Systems, vol. 43, no. 5, pp. 6147–6162, Jan. 2022, doi: 10.3233/JIFS-220132. [66] G. Ghiasi, T.-Y. Lin, and Q. V Le Google Brain, “NAS-FPN: Learning Scalable Feature Pyramid Architecture for Object Detection.” pp. 7036–7045, 2019. [67] X. Chen and A. Gupta, “An Implementation of Faster RCNN with Study for Region Sampling,” Feb. 2017, Accessed: Jun. 24, 2024. [Online]. Available: https://arxiv.org/abs/1702.02138v2 [68] R. Gavrilescu, C. Zet, C. Fosalau, M. Skoczylas, and D. Cotovanu, “Faster R-CNN:an Approach to Real-Time Object Detection,” EPE 2018 - Proceedings of the 2018 10th International Conference and Expositions on Electrical And Power Engineering, pp. 165–168, Dec. 2018, doi: 10.1109/ICEPE.2018.8559776. [69] B. Cheng, Y. Wei, H. Shi, R. Feris, J. Xiong, and T. Huang, “Revisiting RCNN: On Awakening the Classification Power of Faster RCNN.” pp. 453–468, 2018. [70] S. Ren, K. He, R. Girshick, and J. Sun, “Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks,” IEEE Trans Pattern Anal Mach Intell, vol. 39, no. 6, pp. 1137–1149, Jun. 2017, doi: 10.1109/TPAMI.2016.2577031. [71] D. Mehta et al., “Simple and Efficient Architectures for Semantic Segmentation.” pp. 2628–2636, 2022. Accessed: Jun. 24, 2024. [Online]. Available: https://github. [72] J. Wang et al., “Deep High-Resolution Representation Learning for Visual Recognition,” IEEE Trans Pattern Anal Mach Intell, vol. 43, no. 10, pp. 3349–3364, Oct. 2021, doi: 10.1109/TPAMI.2020.2983686. [73] R. Padilla, S. L. Netto, and E. A. B. Da Silva, “A Survey on Performance Metrics for Object-Detection Algorithms,” International Conference on Systems, Signals, and Image Processing, vol. 2020-July, pp. 237–242, Jul. 2020, doi: 10.1109/IWSSIP48289.2020.9145130. [74] Jalaj Agrawal, “Mean Average Precision (mAP) Explained in Object Detection,” Medium. Accessed: Jun. 24, 2024. [Online]. Available: https://medium.com/@jalajagr/mean-average-precision-map-explained-in-object detection-fb61adf67ef4 [75] I. Park and S. Kim, “Performance indicator survey for object detection,” International Conference on Control, Automation and Systems, vol. 2020-October, pp. 284–288, Oct. 2020, doi: 10.23919/ICCAS50221.2020.9268228. PAGE | 88 [76] O. Corcoll, “Semantic Image Cropping,” Jul. 2021, Accessed: Jun. 24, 2024. [Online]. Available: https://www.researchgate.net/publication/353284602_Semantic_Image_Cropping [77] Sean McClure, “Building an End-to-End Defect Classifier Application for Printed Circuit Boards,” Towards Data Science. Accessed: Jun. 24, 2024. [Online]. Available: https://towardsdatascience.com/building-an-end-to-end-deep-learning-defect classifier-application-for-printed-circuit-board-pcb-6361b3a76232 [78] D. Budagam et al., “Instance Segmentation and Teeth Classification in Panoramic X rays,” Jun. 2024, Accessed: Jun. 24, 2024. [Online]. Available: http://arxiv.org/abs/2406.03747 [79] R. Yang, Z. Pan, X. Jia, L. Zhang, and Y. Deng, “A Novel CNN-Based Detector for Ship Detection Based on Rotatable Bounding Box in SAR Images,” IEEE J Sel Top Appl Earth Obs Remote Sens, vol. 14, pp. 1938–1958, 2021, doi: 10.1109/JSTARS.2021.3049851. [80] W. Yao, W. Hua, and H. Wang, “Financial Original Voucher Classification and Verification System Based on Deep Learning,” Advances in Transdisciplinary Engineering, vol. 48, pp. 213–221, Feb. 2024, doi: 10.3233/ATDE231331 |
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